The TF-AUTO-ENET is an Automotive Ethernet Breakout Test Fixture to easily separate bidirectional link traffic.
Automotive Ethernet enables faster data communication to meet the demands of today’s vehicles and the connected vehicles of the future. QPHY-1000Base-T1 automates testing and validation of 1 Gb/s Automotive Ethernet, which is described in the 1000Base-T1 (IEEE 802.3bp) specification.
QPHY-USB3.1-Tx-Rx offers an automated test package for USB 3.1 transmitter and receiver compliance testing, characterization, and debug.
The USB package provides a complete acquisition and analysis system for USB 2.0 devices, hosts, and hubs, as specified in the USB-IF USB 2.0 Electrical Test Specification. The test software implements a full set of electrical tests for USB 2.0, including High-, Full-, and Low-speed tests and is supported by Teledyne LeCroy’s QualiPHY automated test and reporting software.
The Teledyne LeCroy QPHY-SFI solution automates testing for SFI base on the SFF 8431 specifications. The test framework simplifies the test setup and execution of generic and common test requirements such as jitter separation, rise/fall time and transmitter equalization parameters. The guided wizard prompts the user to for specification required patterns and takes the measurements accordingly. The test report includes the test results pass/fail summary, margins and limits, as well as waveforms and measurements used during the test process.
for SATA compliance testing to be used in conjunction with the PeRT3. By leveraging the capabilities of both the oscilloscope and the PeRT3, QPHY-SATA-TSG-RSG can automatically perform all of the PHY, TSG, OOB, and RSG tests as described by the SATA UTD 1.5. Furthermore, QPHY-SATA-TSG can be configured to test Gen1, Gen2, and Gen3 SATA PUTs.
The QPHY-SAS3 Test Solution provides automated control of the SDA 8 Zi-A and LabMaster 10 Zi oscilloscopes for performing all of the transmitter physical layer tests as described by the T10 SAS-3 specification. This specification covers targets and initiators running at 1.5 Gb/s, 3.0 Gb/s, 6.0 Gb/s, and 12.0 Gb/s.
The Teledyne LeCroy QPHY-SAS2 Test Solution provides automated control for the SDA 8 Zi series of oscilloscopes for performing all of the transmitter physical layer tests as described by version 1.01 of the UNH IOL Serial Attached SCSI (SAS) Consortium SAS-2 6Gb/s Physical Layer Test Suite. This specification covers targets and initiators running at 1.5 Gb/s, 3.0 Gb/s and 6.0 Gb/s.
Teledyne LeCroy QPHY-PCIe3 Test Solution provides automated control for Teledyne LeCroy oscilloscopes for performing transmitter physical layer tests as described by the PCI Express Base Specification Revision 3.0 Version 0.9 and the Card Electromechanical Specification Revision 3.0 Version 0.7.
The Teledyne LeCroy QPHY-PCIe Test Solution provides automated control for Teledyne LeCroy oscilloscopes for performing the entire transmitter physical layer tests as described by the Card Electro-mechanical specification Rev 1.1 and 2.0
The Teledyne LeCroy QPHY-MOST50 compliance test package provides a highly automated and easy-to-use solution to MOST compliance testing. QPHY-MOST50 will perform all electrical compliance tests as defined in the MOST Electrical Physical Layer Specification Rev. 1.1.
The Teledyne LeCroy QPHY-MOST150 compliance test package provides a highly automated and easy-to-use solution to MOST compliance testing. QPHY-MOST150 will perform all electrical compliance tests as defined in the MOST150 oPHY Automotive Physical Layer Sub-Specification Rev. 1.1 and MOST150 cPHY Automotive Physical Layer Sub-Specification Rev 1.0.
The QPHY-MIPI-MPHY Test Solution provides automated control of Teledyne LeCroy oscilloscopes for performing transmitter physical layer tests as described by the MIPI Alliance Specification for M-PHY version 3.0.
QPHY-MIPI-DPHY - D-PHY Compliance Package
Test Solution provides automated control for Teledyne LeCroy oscilloscopes for performing transmitter physical layer tests as described by the MIPI Alliance Specification for D-PHY version 1.00.00
The Teledyne LeCroy QPHY-LPDDR2 Test Solution is the best way to characterize LPDDR2 memory interfaces. Capable of performing measurements on 466 MHz, 533 MHz, 667 MHz, 800 MHz, 900 Mhz, 1066 MHz and custom speed grades, QPHY-LPDDR2 has a full suite of Clock, Electrical and Timing tests as specified by the JEDEC Specifications.
automated and easy-to-use solution for HDMI transmitter testing in accordance with Version 2.0 of the HDMI Compliance Test Specification (including testing for version 1.4 devices).
Ethernet testing compliant with IEEE 802.3-2005 requires many test setups and connections and mask tests. Using Teledyne LeCroy QualiPHY-ENET these measurements are easy to setup and complete. Instructive connection diagrams and message boxes appear as pop ups on the oscilloscope screen. The connection diagram instructs the user how to change test fixture and jumper pins in order to do complete test. When the tests are complete, QualiPHY will generate a test report in PDF, HTML, or XML formats. Jitter and pulse mask tests are performed with automatic waveform alignment, and all test results feature pass/fail indicators corresponding to the standard being tested.
QPHY-eDP provides a highly automated and easy-to-use solution for Embedded DisplayPort source testing in accordance with version 1.4 of the VESA Embedded DisplayPort PHY compliance test guideline.
The QPHY-DisplayPort software option provides an automated test environment for running all of the normative real-time oscilloscope tests for sources in accordance with Version 1.2b of the Video Electronics Standards Association (VESA) DisplayPort PHY Compliance Test Specification, as well as tests for HBR3 signals at 8.1 Gbps.
DDR4 is an evolutionary upgrade from DDR3. It introduces data transfer rates which are nearly double the DDR3 transfer rates, ranging from 1.6 GT/s up to 3.2 GT/s. DDR4's higher transfer rates and lower operating voltage have driven new test methodologies and test requirements which were not previously required for DDR3 in order to ensure proper signal fidelity. QPHY-DDR4 has a full suite of Clock, Electrical, and Timing tests as specified by the JEDEC Specification which will aid in DDR4 design validation.
The Teledyne LeCroy QPHY-DDR3 Test Solution is the best way to characterize DDR3, DDR3L, and LPDDR3 memory interfaces. Capable of performing measurements on 800 MT/s, 1066 MT/s, 1333 MT/s, 1600 MT/s, 1866 MT/s, 2133 MT/s and custom speed grades, QPHY-DDR3 has a full suite of Clock, Electrical, and Timing tests as specified by the JEDEC Specification.
The Teledyne LeCroy QPHY-DDR2 Test Solution is the best way to characterize DDR2 memory interfaces. Capable of performing measurements on 400 MHz, 533 MHz, 667 MHz, 800 MHz, 1066 MHz and custom speed grades, QPHY-DDR2 has a full suite of Clock, Electrical and Timing tests as specified by the JEDEC Specification and Intel JEDEC Specifications Addendums.
QPHY-10GBASE-T automated compliance test software performs electrical compliance testing of the Physical Media Attachment (PMA) for 10GBASE-T Ethernet PHY, based on IEEE802.3-2008 requirements.
The Teledyne LeCroy QPHY-10GBase-KR solution automates testing for 10Gigabite Ethernet Copper Backplane base on the IEEE 802.3ap specifications. The test framework simplifies the test setup and execution of generic and common test requirements such as jitter separation, rise/fall time and transmitter equalization parameters. The guided wizard prompts the user to for specification required patterns and takes the measurements accordingly. The test report includes the test results pass/fail summary, margins and limits, as well as waveforms and measurements used during the test process.
Low Noise Edge Shaper
GRL-USB-PD-C1 is a flexible test controller, designed for USB-PD Compliance testing of the Unit Under Test (UUT) and more.
GRL-USB-PD software provides a simple and efficient way to perform USB-PD electrical parametric and protocol measurements. GRL-USB-PD provides waveform visibility and protocol analysis making it ideal for design and debug of USB Type-C Power Delivery silicon and end products.
Electrical Telecom Mask Test Package
DDR Debug Toolkit
The DDR Debug Toolkit provides test, debug and analysis tools for the entire DDR design cycle. The unique DDR analysis capabilities provide automatic Read and Write burst separation, bursted data jitter analysis and DDR-specific measurement parameters.
Automotive Ethernet enables faster data communication to meet the demands of today’s vehicles and the connected vehicles of the future. QPHY-BroadR-Reach automates testing and validation of 100 Mb/s Automotive Ethernet, which is described in both the BroadR-Reach and 100Base-T1 (IEEE 802.3bw) specifications.
- Support for BroadR-Reach V3.2 and 100Base-T1 (IEEE 802.3bw)
- Highly automated and easy-to-use
- Report generation with pass/fail results and fully annotated screenshot
- Complete test solution including test fixture, signal generator & cables
- Unique software recovery algorithm for the distortion test which greatly simplifies test setup
- Supports all PMA Transmitter Tests
- Output Droop
- Master and Slave Timing Jitter
- Clock Frequency
- Distortion (with and without TX_TCLK access)
- Power Spectral Density (PSD)
- Peak Differential Output
- Advanced debugging ability with "Stop on Test"
Automated Compliance Testing
QPHY-BroadR-Reach performs electrical compliance testing of the Physical Media Attachment (PMA) according to the BroadR-Reach and 100Base-T1 specifications. Detailed connection diagrams ensure the proper setup and provide information about the required test pattern for each test. Upon completion of the test session, results are automatically compiled into a comprehensive report including screenshots.
Simplified Distortion Test
To properly perform the Distortion test, the DUT (Device Under Test), disturbing sine wave, and oscilloscope all need to be synchronized. In practice this proves to be a difficult task since the DUT has a clock of 66 2/3 MHz and test equipment uses a 10 MHz reference clock. Teledyne LeCroy has developed a unique algorithm which performs software clock recovery on the Test Mode 4 signal, enabling the test to be completed without requiring a hardware frequency converter board.
Automotive Solutions Experts
Teledyne LeCroy has worked with industry leaders to create the first physical layer test package for the BroadR-Reach. As active participants in OPEN Alliance Technical Committees our test solutions stay up-to-date on evolving test requirements. In addition to Automotive Ethernet, Teledyne LeCroy provides solutions for CAN, CAN FD, LIN, SENT, MOST, FlexRay, and more.
Flexible Debug Environment
Using the "Stop on Test" feature, the user can pause testing after each individual test and observe the results. At that point, any of the oscilloscope's tools can be leveraged for further debug and upon completion, testing can be seamlessly resumed with a click of a button.
Maximum Transmitter Output Droop
The output droop is calculated on both the "+1" and "-1" symbols in the Test Mode 1 waveform. The magnitude of the droop is measured with respect to an initial peak value after the zero crossing (indicated by Max and Min parameters) and the value 500 ns after the initial peak value (indicated by the cursors).
The peak distortion is determined by capturing output from the DUT while it is in Test Mode 4. The MATLAB script provided in the specification removes the disturbing sine wave and measures peak distortion at equally spaced phases of the symbol period. To pass, the script must report less than 15 mV distortion for 10 records.
Transmitter Jitter Timing & Transmit Clock Frequency
The Transmitter Master Jitter Timing and Transmit Clock Frequency are tested simultaneously while the DUT is in Test Mode 2. The Slave Jitter is measured by directly probing the DUT's TX_TCLK while the DUT is configured as a slave.
Transmitter PSD & Peak Differential Output
The Power Spectrum Density (PSD) of the transmitter is tested against the specified limits defined by the mask while the DUT is transmitting Test Mode 5. Using the oscilloscope for the PSD test removes the need to purchase a spectrum analyzer. The Test Mode 5 waveform is also used to test the Peak Differential Output.