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CBL-DE-EMBED

CBL-DE-EMBED

Remove cable effects from your measurements

SDA II Unleash the power of serial data analysis to understand and characterize your design, prove compliance, and determine why a device or host fails compliance.
SDAIII-CompleteLinQ signaling, designers of serial data systems require multi-lane analysis. Unleash the power of multi-lane SDA analysis to perform eye and jitter measurements on up to four lanes, simultaneously.
CBL-DE-EMBED Remove cable effects from your measurements
Eye Doctor II Eye Doctor II provides the channel emulation and de-embedding tools that engineers need for the next generation of serial data standards
PAM4 PAM4 signaling represents a new step in the evolution of serial data signal formats, overcoming some fundamental limitations of traditional NRZ signaling. But with new signal types come new measurement needs. Teledyne LeCroy’s PAM4 analysis package meets these needs by leveraging industry-leading eye, jitter and noise analysis capabilities to perform eye, jitter and noise analysis of PAM4 signals.
SDM Serial Data Mask Package
VirtualProbe By using VirtualProbe, you can understand the characteristics of signals where a physical probe cannot be placed, such as inside of a package or at the end of an interconnect that doesn't physically exist. You can choose to remove effects caused by elements such as fixtures that are not be present in a production configuration, and also add the effects of a device that is to be included but for which only an S-parameter model exists. Use in conjunction with SDAIII products to complete your serial data analysis solution set.
WPHD-SDAIII-COMPLETELINQ Multi-Lane SDA LinQ incl. Eye, Jitter, Noise, Xtalk Meas, EyeDrII & VirtualProbe for WavePro HD
WPHD-EYEDRII-VP Bundle - EyeDrII and VirtualProbe Toolkits
WPHD-EYEDRII Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
WPHD-VIRTUALPROBE Advanced De-embedding, Emulation and Virtual Probing Toolkit
WPHD-SDM Serial Data Mask Software Package for WavePro HD
WPHD-CBL-DE-EMBED Cable De-Embedding Option for WavePro HD
Cable De-embedding

Cable de-embedding is a standard feature on all SDA Zi oscilloscopes and is included with Eye Doctor II. Cable de-embedding gives the user the ability to quickly and easily remove the effect of cables by entering in an attenuation table or attenuation constants that are typically provided by the cable manufacturer.

Adding/Removing Pre- or De-emphasis

Serial data channels have a significant impact on the high frequency content of the serial data signal. Therefore, transmitter designers sometime employ the use of emphasis to pre-compensate for these effects. Eye Doctor II can remove de-emphasis or pre-emphasis from a signal measured at the transmitter output. This is useful when attempting to measure the jitter on such a signal in order to remove the DDj introduced by the de-emphasis. Additionally, Eye Doctor II can add de-emphasis or pre-emphasis to identify the amount necessary to compensate for specific serial data channels.

Cable/Fixture/Serial Data Channel De-embedding

In many typical high frequency measurement situations, engineers desire to connect as directly to their signal as possible and avoid the use of probes. However, even high quality test fixtures, channels, and cables have a negative impact on signal quality that increases with higher signal frequency. While these effects could be ignored at lower frequencies, they should always be accounted for as bit rates increase above 5 Gb/s. If the test fixture, channel, or cable can be electrically quantified in terms of S-parameters using Vector Network Analyzers (VNAs), or Time Domain Reflectometer/Time Domain Transmission (TDR/TDT), then the electrical impact of them can be removed from the measurement result. The result is a measurement that is unaltered by the test setup, and the ability to further measure, apply math, or post-process this true measurement using additional built-in oscilloscope tools, such as parameters, math functions, jitter tracks, histograms, eye diagrams, etc.