Automotive Ethernet enables faster data communication to meet the demands of today’s vehicles and the connected vehicles of the future. QPHY-BroadR-Reach automates testing and validation of 100 Mb/s Automotive Ethernet, which is described in both the BroadR-Reach and 100Base-T1 (IEEE 802.3bw) specifications.
DDR Debug Toolkit
The DDR Debug Toolkit provides test, debug and analysis tools for the entire DDR design cycle. The unique DDR analysis capabilities provide automatic Read and Write burst separation, bursted data jitter analysis and DDR-specific measurement parameters.
Electrical Telecom Mask Test Package
GRL-USB-PD software provides a simple and efficient way to perform USB-PD electrical parametric and protocol measurements. GRL-USB-PD provides waveform visibility and protocol analysis making it ideal for design and debug of USB Type-C Power Delivery silicon and end products.
GRL-USB-PD-C1 is a flexible test controller, designed for USB-PD Compliance testing of the Unit Under Test (UUT) and more.
Low Noise Edge Shaper
The Teledyne LeCroy QPHY-10GBase-KR solution automates testing for 10Gigabite Ethernet Copper Backplane base on the IEEE 802.3ap specifications. The test framework simplifies the test setup and execution of generic and common test requirements such as jitter separation, rise/fall time and transmitter equalization parameters. The guided wizard prompts the user to for specification required patterns and takes the measurements accordingly. The test report includes the test results pass/fail summary, margins and limits, as well as waveforms and measurements used during the test process.
QPHY-10GBASE-T automated compliance test software performs electrical compliance testing of the Physical Media Attachment (PMA) for 10GBASE-T Ethernet PHY, based on IEEE802.3-2008 requirements.
The Teledyne LeCroy QPHY-DDR2 Test Solution is the best way to characterize DDR2 memory interfaces. Capable of performing measurements on 400 MHz, 533 MHz, 667 MHz, 800 MHz, 1066 MHz and custom speed grades, QPHY-DDR2 has a full suite of Clock, Electrical and Timing tests as specified by the JEDEC Specification and Intel JEDEC Specifications Addendums.
The Teledyne LeCroy QPHY-DDR3 Test Solution is the best way to characterize DDR3, DDR3L, and LPDDR3 memory interfaces. Capable of performing measurements on 800 MT/s, 1066 MT/s, 1333 MT/s, 1600 MT/s, 1866 MT/s, 2133 MT/s and custom speed grades, QPHY-DDR3 has a full suite of Clock, Electrical, and Timing tests as specified by the JEDEC Specification.
DDR4 is an evolutionary upgrade from DDR3. It introduces data transfer rates which are nearly double the DDR3 transfer rates, ranging from 1.6 GT/s up to 3.2 GT/s. DDR4's higher transfer rates and lower operating voltage have driven new test methodologies and test requirements which were not previously required for DDR3 in order to ensure proper signal fidelity. QPHY-DDR4 has a full suite of Clock, Electrical, and Timing tests as specified by the JEDEC Specification which will aid in DDR4 design validation.
The QPHY-DisplayPort software option provides an automated test environment for running all of the normative real-time oscilloscope tests for sources in accordance with Version 1.2b of the Video Electronics Standards Association (VESA) DisplayPort PHY Compliance Test Specification, as well as tests for HBR3 signals at 8.1 Gbps.
QPHY-eDP provides a highly automated and easy-to-use solution for Embedded DisplayPort source testing in accordance with version 1.4 of the VESA Embedded DisplayPort PHY compliance test guideline.
Ethernet testing compliant with IEEE 802.3-2005 requires many test setups and connections and mask tests. Using Teledyne LeCroy QualiPHY-ENET these measurements are easy to setup and complete. Instructive connection diagrams and message boxes appear as pop ups on the oscilloscope screen. The connection diagram instructs the user how to change test fixture and jumper pins in order to do complete test. When the tests are complete, QualiPHY will generate a test report in PDF, HTML, or XML formats. Jitter and pulse mask tests are performed with automatic waveform alignment, and all test results feature pass/fail indicators corresponding to the standard being tested.
automated and easy-to-use solution for HDMI transmitter testing in accordance with Version 2.0 of the HDMI Compliance Test Specification (including testing for version 1.4 devices).
The Teledyne LeCroy QPHY-LPDDR2 Test Solution is the best way to characterize LPDDR2 memory interfaces. Capable of performing measurements on 466 MHz, 533 MHz, 667 MHz, 800 MHz, 900 Mhz, 1066 MHz and custom speed grades, QPHY-LPDDR2 has a full suite of Clock, Electrical and Timing tests as specified by the JEDEC Specifications.
QPHY-MIPI-DPHY - D-PHY Compliance Package
Test Solution provides automated control for Teledyne LeCroy oscilloscopes for performing transmitter physical layer tests as described by the MIPI Alliance Specification for D-PHY version 1.00.00
The QPHY-MIPI-MPHY Test Solution provides automated control of Teledyne LeCroy oscilloscopes for performing transmitter physical layer tests as described by the MIPI Alliance Specification for M-PHY version 3.0.
The Teledyne LeCroy QPHY-MOST150 compliance test package provides a highly automated and easy-to-use solution to MOST compliance testing. QPHY-MOST150 will perform all electrical compliance tests as defined in the MOST150 oPHY Automotive Physical Layer Sub-Specification Rev. 1.1 and MOST150 cPHY Automotive Physical Layer Sub-Specification Rev 1.0.
The Teledyne LeCroy QPHY-MOST50 compliance test package provides a highly automated and easy-to-use solution to MOST compliance testing. QPHY-MOST50 will perform all electrical compliance tests as defined in the MOST Electrical Physical Layer Specification Rev. 1.1.
The Teledyne LeCroy QPHY-PCIe Test Solution provides automated control for Teledyne LeCroy oscilloscopes for performing the entire transmitter physical layer tests as described by the Card Electro-mechanical specification Rev 1.1 and 2.0
Teledyne LeCroy QPHY-PCIe3 Test Solution provides automated control for Teledyne LeCroy oscilloscopes for performing transmitter physical layer tests as described by the PCI Express Base Specification Revision 3.0 Version 0.9 and the Card Electromechanical Specification Revision 3.0 Version 0.7.
The Teledyne LeCroy QPHY-SAS2 Test Solution provides automated control for the SDA 8 Zi series of oscilloscopes for performing all of the transmitter physical layer tests as described by version 1.01 of the UNH IOL Serial Attached SCSI (SAS) Consortium SAS-2 6Gb/s Physical Layer Test Suite. This specification covers targets and initiators running at 1.5 Gb/s, 3.0 Gb/s and 6.0 Gb/s.
The QPHY-SAS3 Test Solution provides automated control of the SDA 8 Zi-A and LabMaster 10 Zi oscilloscopes for performing all of the transmitter physical layer tests as described by the T10 SAS-3 specification. This specification covers targets and initiators running at 1.5 Gb/s, 3.0 Gb/s, 6.0 Gb/s, and 12.0 Gb/s.
for SATA compliance testing to be used in conjunction with the PeRT3. By leveraging the capabilities of both the oscilloscope and the PeRT3, QPHY-SATA-TSG-RSG can automatically perform all of the PHY, TSG, OOB, and RSG tests as described by the SATA UTD 1.5. Furthermore, QPHY-SATA-TSG can be configured to test Gen1, Gen2, and Gen3 SATA PUTs.
The Teledyne LeCroy QPHY-SFI solution automates testing for SFI base on the SFF 8431 specifications. The test framework simplifies the test setup and execution of generic and common test requirements such as jitter separation, rise/fall time and transmitter equalization parameters. The guided wizard prompts the user to for specification required patterns and takes the measurements accordingly. The test report includes the test results pass/fail summary, margins and limits, as well as waveforms and measurements used during the test process.
The USB package provides a complete acquisition and analysis system for USB 2.0 devices, hosts, and hubs, as specified in the USB-IF USB 2.0 Electrical Test Specification. The test software implements a full set of electrical tests for USB 2.0, including High-, Full-, and Low-speed tests and is supported by Teledyne LeCroy’s QualiPHY automated test and reporting software.
SuperSpeed USB is one of most highly anticipated standards in several years. At 10x the data rate of USB 2.0 and with new features like CTLE (continuous time linear equalization) and reference channels, SuperSpeed USB will pose new challenges to implementers.
QPHY-USB3.1-Tx-Rx offers an automated test package for USB 3.1 transmitter and receiver compliance testing, characterization, and debug.
Automotive Ethernet enables faster data communication to meet the demands of today’s vehicles and the connected vehicles of the future. QPHY-1000Base-T1 automates testing and validation of 1 Gb/s Automotive Ethernet, which is described in the 1000Base-T1 (IEEE 802.3bp) specification.
The TF-AUTO-ENET is an Automotive Ethernet Breakout Test Fixture to easily separate bidirectional link traffic.
More Measurement Cycles Provides Highest Confidence in Less Time
- DDR3 test coverage as described by JESD79-3F
- DDR3L test coverage as described by JESD79-3-1A
- LPDDR3 test coverage as described by JESD209-3B
- Support for:
- 800 MT/s
- 1066 MT/s
- 1333 MT/s
- 1600 MT/s
- 1866 MT/s
- 2133 MT/s
- Custom speeds
- Fastest way to gain confidence in your DDR3 interface by measuring a large number of cycles and reporting statistically relevant results
- Fully annotated worst case measurement screenshot captured and displayed in report including trace labels and pertinent voltage levels
- Stop on test/failure capability allows the user to pause at a particular test and review the measurement on the oscilloscope display
Due to the high level of variability in DDR3 measurements, it is important to measure a large number of cycles. By measuring a large number of cycles in a very short period of time, the user can be more confident that they are catching the true maximum and minimum points for their measurement. In many cases, QPHY-DDR3 will perform several thousand measurements in the same time competitive equipment will perform less than 100. This allows you to achieve statistical relevance in a single run of QPHY-DDR3 without requiring multiple acquisitions over a long period of time.
Advanced Debug Capability
Using the “Stop on Test” capability built in to QPHY-DDR3, the user can pause the testing at the completion of each individual test. QPHY-DDR3 will prompt the oscilloscope to save the panel file to preserve the current state of the oscilloscope. The user is then free to perform additional debugging of any particular test to aid root cause analysis. Root causes of failure can be quickly and easily found using all of the advanced serial data tools within the oscilloscope. These include: SDA III, Eye Doctor™ II, WaveScan™, Histograms, Tracks, and many more—making it easy to correlate anomalies with other observed behaviors. Once the user has completed debugging that particular test, they simply click on the “Ok” button in QPHY-DDR3 to resume running the remainder of the selected tests.
These tests perform all of the clock tests as described by the appropriate JEDEC specification. These include average clock period, absolute clock period, average high/low pulse width, absolute high/low pulse width, half period jitter, clock period jitter, cycle-to-cycle period jitter and cumulative error over n period tests.
Shown above, the SlewR test measures the slew rates of the data, strobe, and clock signals. A 2 Mpt acquisition was taken and all of the write bursts were identified. Then every rising edge slew rate was measured. In this case over 1,400 slew rate measurements were performed. As shown above, the worst instance of this measurement will be displayed on the screen. Additionally, the “Stop on Test” ability can be used to perform further analysis on this test to determine the root cause of a failure.
Shown above, the tDQSCK test verifies the strobe output access time from the clock signal. Similar to the electrical tests, a 2 Mpt acquisition was taken and all of the read bursts were identified. Then the time between every strobe edge and its associated clock were measured. In this case over 10,000 tDQSCK measurements were performed. Shown above, the worst instance of this measurement is displayed on the screen. An additional probe can be utilized to capture a separate signal on the board to aid in failure analysis.
Eye Diagrams are a powerful tool for debugging serial data signals. QPHY-DDR3 enables the user to create eye diagrams of both the Read and the Write data bursts to ensure that the signal integrity is sufficient such that the data will be sampled properly by the receiver. Additionally, the Eye Diagram for the Data Signal and the Strobe signal are shown at the same time to ensure proper strobe timing.
QualiPHY is designed to reduce the time, effort, and specialized knowledge needed to perform compliance testing on high-speed serial buses.
- Guides the user through each test setup
- Performs each measurement in accordance with the relevant test procedure
- Compares each measured value with the applicable specification limits
- Fully documents all results
- QualiPHY helps the user perform testing the right way—every time!