You face tough testing problems.Shrinking geometries and increasinglycomplex assemblies are makingyour job even tougher. Getting aprobe in and out of a loaded cardcage safely has become difficult, ifnot impossible. Are you finding thatimprovising test fixtures, or requiringthe aid of an assistant (or two) doesn’tquite do the job? And micrometerbasedpositioners are too slow.
Simplicity and Flexibility
The EZ-Probe Positioner solves yourprobe placement problems by providingeasy, precise manual probepositioning control in three axes.Motion in any direction is accomplishedwith a single control. Thejoystick pivots like a conventionaljoystick for X-Y positioning, andslides up and down at the same timefor Z positioning. The motion of theprobe matches the motion of yourhand and feels so completely natural,you’ll be making good measurementsin minutes. And 3:1 motion reductiontriples your accuracy comparedto handheld probes alone.
Stability and Speed
The EZ-Probe Positioner comesequipped with a fully-articulatingarm, providing 30cm (12 inch) reachin virtually any direction. The armssingle clutch locks in your startingposition with a simple twist. Thevacuum-mount base keeps the EZProbePositioner in place in any testenvironment and the solid brass baseis heavy enough to also be used withoutvacuum.
The X-Y-Z joystick has separatefriction controls which let you movein the X-Y plane or the Z-axis independently,while still allowing concurrentmotion. These controls firmlymaintain position after the handleis released, giving you absolute confidencein your probe placement.Studies show no drift on a 50 μmsquare pad after two days.
The EZ-Probe Positioner is soeasy to use that the learning curve isvirtually eliminated. Setup and placementis ten times faster than traditionalX-Y-Z micropositioners. You’llimmediately begin making bettermeasurements in less time.
The EZ-Probe Positioner minimizesmany of the hidden costs of devicetesting. Its solid control, and 50 μm(2 mil) placement accuracy greatlyreduce the risk of damage to fragilefine-pitch traces, expensive boardsand modules, or valuable first prototypes.Its flexibility and adaptabilityeliminate the time lost on trial anderror of improvised kluge solutionsto tough testing situations.
- Choice of 13, 16, 20 and 25 GHz bandwidth models
- Bandwidth rating is for probe + oscilloscope combined
- Optimized probe + oscilloscope performance, automatically
- 2.0Vpk-pk dynamic range
- ±2.5V offset range
- Probe System (-PS models) provide complete capability
- Deluxe soft carrying case
- Long-length solder-in tip with field replaceable resistors
- Carbon-composite browser tips optimize signal fidelity and loading
- Superior probe impedance for minimized loading
- Probe noise as low as 14 nV/√Hz
WaveLink High Bandwidth (13-25) GHz Differential Probes
Complete Probe System
A value-priced, comprehensive bundle of all items including differential amplifier, solder-in tips (qty. 2) and positioner (browser) tip (qty. 1), platform/cable assembly, assorted interconnect parts, mounting devices, and other accessories, and a deluxe soft carrying case to hold all items. This makes selection as easy as simply choosing the bandwidth that you require.
High Dynamic Range and Offset
Exceptionally high dynamic range (2.0Vpk-pk) at high bandwidths (up to 25 GHz) and large offset capability as well.
Deluxe Soft Carrying Case
A deluxe soft carrying case conveniently holds all components of the probe system
High-Performance Solder-in Tip
Long-length solder-in tip with field replaceable resistors. External tip resistors locate the tip resistance as close to the point of contact as possible to minimize circuit loading.